The HP 4284A is a general purpose LCR meter for incoming inspection
of components, quality control, and laboratory use.
The HP 4284A is used for evaluating LCR components, materials, and semiconductor devices over a wide range of frequencies (20 Hz to 1 MHz) and test signal levels (5 mV to 2 Vrms, 50 mA to 20 mArms). With Option 001 the HP 4284A's test signal level range spans 5 mV to 20 Vrms, and 50 mA to 100 mArms.
The HP 4284A offers C-D measurements with a basic accuracy of +/- 0.05% (C), +/- 0.0005 (D) at all test frequencies with six digit resolution (the dissipation factor resolution is 0.000001) on every range.
With its built-in comparator, the HP 4284A can output comparison/decision results for sorting components into a maximum of ten bins. By using the handler interface and scanner interface options, the HP 4284A can easily be combined with a component handler, a scanner, and a system controller to fully automate component testing, sorting, and quality control data processing.
The HP 4284A's new list sweep function permits entry of up to ten frequencies, test signal levels, or bias level points to be automatically measured.
The HP-IB interface is a standard interface on the HP 4284A and can
be used to build an automatic test system to completely characterize new
components and materials, and to fully automatic production line testing.
GENERAL
POWER REQUIREMENTS:
Line Voltage: 100, 120, 220 Vac +/- 10%, 240 Vac +5% -10%
Line Frequency: 47 to 66 Hz
Power Consumption: 200 VA max.OPERATING ENVIRONMENT:
Temperature: 0 °C to 55 °C
Humidity: <= 95% R.H. at 40 °CDIMENSIONS:
426 (W) by 177 (H) by 498 (D) (mm)WEIGHT:
Approximately 15 kg (33 lb., standard)DISPLAY:
LCD dot-matrix display.
Capable of displaying:
Measured values
Control settings
Comparator limits and decisions
List sweep tables
Self test message and annunciations
Number of display digits:
6-digits, maximum display count 999999
MEASUREMENT FUNCTIONS
Measurement Parameters:
|Z|: Absolute value of impedance
|Y|: Absolute value of admittance
L: Inductance
C: Capacitance
R: Resistance
G: Conductance
D: Dissipation factor
Q: Quality factor
Rs: Equivalent series resistance
Rp: Parallel resistance
C: Reactance
B: Susceptance
q: Phase angleCombinations:
|Z|, |Y| L, C R G q(deg), q(rad) D, Q, Rs, Rp, G C B Mathematical Functions:
The deviation and the Percent of Deviation of measurement values from a programmable reference value.Equivalent Measurement Circuit:
Parallel and SeriesRanging:
Auto and Manual (Hold/UP/Down)Trigger:
Internal, External, BUS (HP-IB) and Manual.Delay Time:
Programmable delay from the trigger command to the start of the measurement, 0 to 60.000 s in 1 ms steps.Measurement terminals:
Four-terminal pairTest Cable Length:
Standard: 0 m and 1 m selectable
(with Option 006: 0 m, 1 m, 2 m and 4 m selectable)Integration Time:
Short, Medium and Long
(see Supplemental Performance Characteristics for the measurement time)Averaging:
1 to 256, programmable
TEST SIGNAL
Frequency:
20 Hz to 1 MHz, 8610 selectable frequencies
(refer to APPENDIX G for selectable frequencies)Accuracy:
+/- 0.01 %Signal Modes:
Normal: Programs selected voltage or current at the measurement terminals when they are opened or shorted, respectively.
Constant: Maintains selected voltage or current at the device under test independent of changes in the device's impedance.Signal Level:
* : Automatic Level Control Function is set to ON.
Mode Range Setting Accuracy Voltage Non-constant
Constant *5 mVrms to 2 Vrms
10 mVrms to 1 Vrms+/- (10% + 1 mVrms)
+/- (6% + 1 mVrms)Current Non-constant
Constant *50 mArms to 20 mArms
100 mArms to 10 mArms+/- (10% + 10 mArms)
+/- (6% + 10 mArms)Output Impedance:
100 W +/- 3%Test Signal Level Monitor:
1 : Add the impedance measurement accuracy (%) to the voltage level monitor accuracy when the DUT's impedance is < 100 W.
Mode Range Accuracy Voltage 1 5 mVrms to 2 Vrms
0.01 mVrms to 5 mVrms+/- (3% of reading + 0.5 mVrms)
+/- (11% of reading + 0.1 mVrms)Current 2 50 mArms to 20 mArms
0.001 mArms to 50 mArms+/- (3% of reading + 5 mArms)
+/- (11% of reading+1 mArms)
2 : Add the impedance measurement accuracy (%) to the current level monitor accuracy when the DUT's impedance is >=100 W.
Accuracies apply when test cable length is 0 m or 1 m. Additional error when test cable length is 2 m or 4 m is given as:
fm x L/2 (%)
Where, fm is test frequency (MHz), L is test cable length (m).
Example: DUT's impedance: 50 W
Test signal level: 0.1 Vrms
Measurement accuracy: 0.1 %
then, Voltage level monitor accuracy is
+/- (3.1 % of reading + 0.5 mVrms)
DISPLAY RANGE
Parameter Range |Z|, R, C
|Y|, G, B
C
L
D
Q
q
D %0.01 mW to 99.9999 MW
0.01nS to 99.9999S
0.01 fF to 9.99999 F
0.01 nH to 99.9999 kH
0.000001 to 9.99999
0.01 to 99999.9
-180.000 º to 180.000 º
-999.999% to 999.999%
ABSOLUTE MEASUREMENT ACCURACY
Absolute measurement accuracy is given as the sum of the relative measurement accuracy plus the calibration accuracy.|Z|, |Y|, L, C, R, C, G and B accuracy:
|Z|, |Y|, L, C, R, C, G and B accuracy is given as:D accuracy:
Ae + Acal (%)
where Ae is the relative accuracy, Acal is the calibration accuracy.
L, C, C, and B accuracies apply when Dx (measured D value) <= 0.1
R and G accuracies apply when Qx (measured Q value) <= 0.1
G accuracy described in this paragraph apples to the G-B combination only.D accuracy is given as:Q accuracy:
De + qcal
where De is the relative D accuracy, qcal is the calibration accuracy (radian).
Accuracy applies when Dx (measured D value) <= 0.1Q accuracy is given as:q accuracy:
(+/-) {Qx2 x Da} / {1 (-/+) Qx x Da}
where Qx is the measured Q value, Da is the absolute D accuracy.
Accuracy applies when Qx x Da < 1q accuracy is given as:G accuracy: when Dx (measured D value) <= 0.1
qe + qcal (deg)
where qe is the relative q accuracy (deg), and qcal is the calibration accuracy (deg).G accuracy is given as:Rp accuracy: when Dx (measured D value) <= 0.1
Bx x Da (S)
Bx = 2pfCx = 1/(2pfLx)
where Bx is the measured B value (S), Cx is the measured C value (F), Lx is the measured L value (H), Da is the absolute D accuracy, f is the test frequency (Hz).
G accuracy described in this paragraph applies to the Cp-G and Lp-G combinations only.Rp accuracy is given as:Rs accuracy: when Dx (measured D value) <= 0.1
(+/-) {Rpx x Da} / {Dx (-/+) Da} (W)
where Rpx is the measured Rp value (W), Dx is the measured D value, Da is the absolute D accuracy.Rs accuracy is given as:
Cx x Da (W)
Cx = 2pfLx = 1/(2pfCx)
where Cx is the measured C value (W), Cx is the measured C value (F), Lx is the measured L value (H), Da is the absolute D accuracy, f is the test frequency (Hz).
RELATIVE MEASUREMENT ACCURACY
Relative measurement accuracy includes stability, temperature coefficient, linearity, repeatability and calibration interpolation error.
Relative measurement accuracy is specified when all of the following conditions are satisfied:
(1) Warm-up time: >= 30 minutesFor relative measurement accuracy , ask for specific performance characteristics.
(2) Test cable length: 0 m, 1 m, 2 m or 4 m (HP 16048 A/B/D/E)
For 2 m or 4 m cable length operation, test signal voltage and test frequency are set according to Figure A.
(2 m and 4 m cable can be used only when Option 006 is installed.)
(3) OPEN and SHORT corrections have been performed.
(4) Bias current isolation: OFF
(For accuracy with bias current isolation, refer to supplemental performance characteristics.)
(5) Test signal voltage and DC bias voltage are set according to Figure B.
(6) The optimum measurement range is selected by matching the DUT's impedance to the adequate effective
measuring range (e.g. if the DUT's impedance is 50 kW, the optimum range is the 30kW range.)
CORRECTION FUNCTIONS
Zero open:
Eliminates measurement errors due to parasitic stray impedances of the test fixture.Zero short:
Eliminates measurement errors due to parasitic residual impedances of the test fixture.Load:
Improves the measurement accuracy by using a working standard (calibrated device) as a reference.
LlST SWEEP
A maximum of 10 frequencies or test signal levels can be programmed.
Single or sequential test can be performed.
When Option 001 is installed, DC bias voltages can also be programmed.
COMPARATOR FUNCTION
Ten bin sorting for the primary measurement parameter, and IN/OUT decision output for the secondary measurement parameter.Sorting Modes:
Sequential mode: Sorting into unnested bins with absolute upper and lower limits.
Tolerance mode: Sorting into nested bins with absolute or percent limits.Bin Count:
0 to 999999List Sweep Comparator:
HIGH/IN/LOW decision output for each point in the list sweep table.
DC BIAS
0 V, 1.5 V and 2 V, selectable
Setting accuracy: :t5% (1.5 V, 2 V)
OTHER FUNCTIONS
Store/Load:
Ten instrument control settings, including comparator limits and list sweep programs, can be stored and loaded from and into the internal non-volatile memory. Ten additional settings can also be stored and loaded from each removable Memory Card.HP-IB:
All control settings, measured values, comparator limits, list sweep program. ASCII and 64-bit binary data format. HP-IB buffer memory can store measured values for a maximum of 128 measurements and output packed data over the HP-IB bus. Complies with IEEE-488.1 and 488.2. The programming language is HP-SL.Interface Functions:
SH1, AH1, T5, L4, SR1, RL1, DC1, DT1, CQ, E1Self Test:
Softkey controllable. Provides a means to confirm proper operation.
INSTALLED OPTIONS : OPTION 001 (Power Amp/DC Bias)
Increases test signal level and adds the Variable DC Bias voltage function.TEST SIGNAL
Test Signal Level:DC BIAS* : Automatic Level Control Function is set to ON.
Mode Range Setting Accuracy Voltage Non-constant
Constant *5 mVrms to 20 Vrms
10 mVrms to 10 Vrms+/- (10% + 1 mVrms)
+/- (10% + 1 mVrms)Current Non-constant
Constant *50 mArms to 200 mArms
100 mArms to 100 mArms+/- (10% + 10 mArms)
+/- (10% + 10 mArms)Output Impedance:
100 W +/- 6%Test Signal Level Monitor:
1 : Add the impedance measurement accuracy (%) to the voltage level monitor accuracy
Mode Range Accuracy Voltage 1 > 2 Vrms
5 mVrms to 2 Vrms
0.01 mVrms to 5 mVrms+/- (3% of reading + 5 mVrms)
+/- (3% of reading + 0.5 mVrms)
+/- (11% of reading + 0.1 mVrms)Current 2 > 20 mArms
50 mArms to 20 mArms
0.001 mArms to 50 mArms+/- (3% of reading + 50 mArms)
+/- (3% of reading + 5 mArms)
+/- (11% of reading + 1 mArms)
when the DUT's impedance is < 100 W.
2 : Add the impedance measurement accuracy (%) to the current level monitor accuracy
when the DUT's impedance is >=100 W.
Accuracies apply when test cable length is 0 m or 1 m. Additional error when test cable length is 2 m or 4 m is given as:
fm x L/2 (%)
Where, fm is test frequency (MHz), L is test cable length (m).
Example: DUT's impedance: 50 W
Test signal level: 0.1 Vrms
Measurement accuracy: 0.1 %
then, Voltage level monitor accuracy is
+/- (3.1 % of reading + 0.5 mVrms)DC Bias Level:
The following DC bias level accuracy is specified for an ambient temperature range of 23ºC +/- 5ºC.Test Signal Level <= 2 Vrms:
Voltage Range Resolution Setting Accuracy +/-(0.000 to 4.000) V
+/-(4.002 to 8.000) V
+/-(8.005 to 20.000) V
+/-(20.01 to 40.00) V1 mV
2 mV
5 mV
10 mV+/- (0.1% of setting + 1 mV)
+/- (0.1% of setting + 2 mV)
+/- (0.1% of setting + 5 mV)
+/- (0.1% of setting + 10 mV)Test Signal Level > 2 Vrms:
Voltage Range Resolution Setting Accuracy +/-(0.000 to 4.000) V
+/-(4.002 to 8.000) V
+/-(8.005 to 20.000) V
+/-(20.01 to 40.00) V1 mV
2 mV
5 mV
10 mV+/- (0.1% of setting + 3 mV)
+/- (0.1% of setting + 4 mV)
+/- (0.1% of setting + 7 mV)
+/- (0.1% of setting + 12 mV)Setting accuracies apply when the bias current isolation function is set to OFF. When the bias current isolation function is set to ON, add +/- 20 mV to each accuracy value (DC bias current <= 1 mA).Bias Current Isolation function:
A maximum DC bias current of 100 mA (typical value) can be applied to the DUT.DC Bias Monitor Terminal:
Rear panel BNC connector
STABILITY
MEDIUM integration time and operating temperature at 23°C +/- 5°C
|Z|, |Y|, L, C, R < 0.01 % / day
D < 0.0001 / dayTEMPERATURE COEFFICIENT
MEDIUM integration time and operating temperature at 23°C +/- 5°C
Test Signal Level |Z|, |Y|, L, C, R D >= 20 mVrms
< 20 mVrms< 0.0025% / ºC
< 0.0075% / ºC< 0.000025% / ºC
< 0.000075% / ºCSETTLING TIME
Frequency (fm):
< 70 ms (fm >= 1 kHz)
< 120 ms (100 Hz <= fm < 1 kHz)
< 160 ms (fm < 100 Hz)Test Signal Level:
< 120 msMeasurement Range:
< 50 ms / range shift (fm >= 1 kHz)INPUT PROTECTION
Internal circuit protection, when a charged capacitor is connected to the Unknown terminals.
The maximum capacitor voltage is:
Vmax = {1/C}1/2 (V)
where Vmax <= 200 V and C is in Farads.MEASUREMENT TIME
Typical measurement times from the trigger to the output of EOM at the Handler Interface.
(EOM: End of Measurement)
Integ.
TimeTest Frequency 100 Hz 1 kHz 10 kHz 1 MHz SHORT
MEDIUM
LONG270 ms
400 ms
1040 ms40 ms
190 ms
830 ms30 ms
180 ms
820 ms30 ms
180 ms
820 msDisplay Time:
Display time for each display format is given asMEAS DISPLAY page approx. 8 msHP-IB Data Output Time:
BIN No. DISPLAY page approx. 5 ms
BIN COUNT DISPLAY page approx. 0.5 ms
Internal HP-IB data processing time from EOM output to measurement data output on HP-IB lines (excluding display time),
approx. 10 msDC BIAS (1.5 V / 2 V)
Output Current: 20 mA max.OPTION 001 (Power Amp/DC Bias) -INSTALLED OPTION-
DC Bias Voltage:DC bias voltage applied to DUT (Vdut) is given as:DC Bias Current:
Vdut = Vb - 100 x Ib (V)
where Vb is DC bias setting voltage (V), Ib is DC bias current (A).DC bias current applied to DUT (Idut) is given as:Relative Measurement Accuracy with Bias Current Isolation:
Idut = Vb / (100 + Rdc) (A)
where Vb is DC bias setting voltage (V), Rdc is the DUT's DC resistance (W).
Maximum DC bias current when the normal measurement can be performed is as follows:
Measurement Range 10 W 100 W 300 W 1 kW 3 kW 10 kW 30 kW 100 kW Bias Current
IsolationOn 100 mA Off 2 mA 2 mA 2 mA 1 mA 300 mA 100 mA 30 mA 10 mA When the bias current isolation function is set to ON, add the display fluctuation (N) given in the following equation to the Ae relative measurement accuracy (refer to "relative measurement accuracy" of specification).DC Bias Settling Time:
The following equation is specified when all of the following conditions are satisfied:
DUT impedance >= 100 W
Test signal level setting <= 1 Vrms
DC bias current >= 1 mA
Integration time: MEDIUMN = P x {DUT impedance (W) / Measurement Range (W)} x {DC bias current (mA) / Test signal level (Vrms)} x {1 / n1/2} x 10-4 (%)
where n is the number of averaging, P is the coefficient listed on the next table:
When the DC bias current is less than 1 mA, apply N value at 1 mA.
Meas.
RangeTest Frequency, fm (Hz) 20 <= fm < 100 100 <= fm < 1 k 1 k <= fm < 10 k 10 k <= fm <=1 M 100 W
300 W
1 kW
3 kW
10 kW
30 kW
100 kW0.75
2.5
7.5
25
75
250
7500.225
0.75
2.25
7.5
22.5
75
2250.045
0.15
0.45
1.5
4.5
15
450.015
0.05
0.15
0.5
1.5
5
15
When integration time is set to SHORT, multiply N value by 5.
When integration time is set to LONG, multiply N value by 0.5.Calculation Example:
Measurement Conditions:
DUT: 100 pF
Test signal level: 20 mVrms
Test frequency: 10 kHz
Integration time: MEDIUM
Then,
DUT's impedance = 1 / (2px 104 x100 x 10-1 2) = 159 kW
Measurement range is 100 W
DC bias current << 1 mA
P = 15 (according to previous table)
Ae of relative measurement accuracy without bias current isolation is +/- 0.22 (%) (refer to "relative measurement accuracy" of specification).
Then,
N = 15 x (159 x 103) / (100 x 103) x 1 / (20 x 10-3) x 10-4 = 0.12 (%)
Therefore,
Relative Capacitance measurement accuracy is:
+/- (0.22+0.12) = +/- 0.34 (%)When DC bias is set to ON, add the settling time listed in the following table to the measurement time.
This settling time does not include the DUT charge time.
Test Frequency (fm) Bias Current Isolation ON OFF 20 Hz <= fm < 1 kHz 210 ms 1 kHz <= fm < 10 kHz 70 ms 20 ms 10 kHz <= fm <= 1MHz 30 ms